American Journal of Polymer Science and Technology

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Investigation of the Dependence of Thickness and Roughness of TiO2 Thin Films Fabricated Using Pulsed Laser Deposition on the Laser Energy

Received: Mar. 02, 2019    Accepted: Apr. 08, 2019    Published: May 15, 2019
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Abstract

In this work Titanium Dioxide thin films were successfully deposited on glass substrates at room temperature by pulsed laser deposition technique (PLD) using a Q-switch Nd: YAG laser to fabricate thin films. The target was an Anatase TiO2 powder that converted to solid disks by compressing it. The disks were irradiated with different laser pulse energies (100, 150 and 200 mJ) with the same number of laser pulses (10 pulses) and the same laser repetition rate to fabricate three groups of thin film (I, II and III). An atomic force microscopy (AFM) was used for the characterization of the thickness and topography of these thin films. The results showed that the thickness of the films was in the range of hundreds nanometers and it is increased exponentially with the laser energy. The dependence of the root means squire roughness (RMS) on laser pulse energy also was investigated and the results showed that the (RMS) increase exponentially as laser pulse energy to specific value, and then decrease exponentially that the whole curve looks like Gaussian shape.

DOI 10.11648/j.ajpst.20190502.11
Published in American Journal of Polymer Science and Technology ( Volume 5, Issue 2, June 2019 )
Page(s) 35-39
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This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited.

Copyright

Copyright © The Author(s), 2024. Published by Science Publishing Group

Keywords

TiO2 Thin Films, Pulsed Laser Deposition, Nano-Films, Roughness, AFM

References
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    Ahmed Mohamed Salih, Nafie Abdallatief Almuslet, Abdelmoneim Mohamed Awadelgied. (2019). Investigation of the Dependence of Thickness and Roughness of TiO2 Thin Films Fabricated Using Pulsed Laser Deposition on the Laser Energy. American Journal of Polymer Science and Technology, 5(2), 35-39. https://doi.org/10.11648/j.ajpst.20190502.11

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    ACS Style

    Ahmed Mohamed Salih; Nafie Abdallatief Almuslet; Abdelmoneim Mohamed Awadelgied. Investigation of the Dependence of Thickness and Roughness of TiO2 Thin Films Fabricated Using Pulsed Laser Deposition on the Laser Energy. Am. J. Polym. Sci. Technol. 2019, 5(2), 35-39. doi: 10.11648/j.ajpst.20190502.11

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    AMA Style

    Ahmed Mohamed Salih, Nafie Abdallatief Almuslet, Abdelmoneim Mohamed Awadelgied. Investigation of the Dependence of Thickness and Roughness of TiO2 Thin Films Fabricated Using Pulsed Laser Deposition on the Laser Energy. Am J Polym Sci Technol. 2019;5(2):35-39. doi: 10.11648/j.ajpst.20190502.11

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  • @article{10.11648/j.ajpst.20190502.11,
      author = {Ahmed Mohamed Salih and Nafie Abdallatief Almuslet and Abdelmoneim Mohamed Awadelgied},
      title = {Investigation of the Dependence of Thickness and Roughness of TiO2 Thin Films Fabricated Using Pulsed Laser Deposition on the Laser Energy},
      journal = {American Journal of Polymer Science and Technology},
      volume = {5},
      number = {2},
      pages = {35-39},
      doi = {10.11648/j.ajpst.20190502.11},
      url = {https://doi.org/10.11648/j.ajpst.20190502.11},
      eprint = {https://download.sciencepg.com/pdf/10.11648.j.ajpst.20190502.11},
      abstract = {In this work Titanium Dioxide thin films were successfully deposited on glass substrates at room temperature by pulsed laser deposition technique (PLD) using a Q-switch Nd: YAG laser to fabricate thin films. The target was an Anatase TiO2 powder that converted to solid disks by compressing it. The disks were irradiated with different laser pulse energies (100, 150 and 200 mJ) with the same number of laser pulses (10 pulses) and the same laser repetition rate to fabricate three groups of thin film (I, II and III). An atomic force microscopy (AFM) was used for the characterization of the thickness and topography of these thin films. The results showed that the thickness of the films was in the range of hundreds nanometers and it is increased exponentially with the laser energy. The dependence of the root means squire roughness (RMS) on laser pulse energy also was investigated and the results showed that the (RMS) increase exponentially as laser pulse energy to specific value, and then decrease exponentially that the whole curve looks like Gaussian shape.},
     year = {2019}
    }
    

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  • TY  - JOUR
    T1  - Investigation of the Dependence of Thickness and Roughness of TiO2 Thin Films Fabricated Using Pulsed Laser Deposition on the Laser Energy
    AU  - Ahmed Mohamed Salih
    AU  - Nafie Abdallatief Almuslet
    AU  - Abdelmoneim Mohamed Awadelgied
    Y1  - 2019/05/15
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    N1  - https://doi.org/10.11648/j.ajpst.20190502.11
    DO  - 10.11648/j.ajpst.20190502.11
    T2  - American Journal of Polymer Science and Technology
    JF  - American Journal of Polymer Science and Technology
    JO  - American Journal of Polymer Science and Technology
    SP  - 35
    EP  - 39
    PB  - Science Publishing Group
    SN  - 2575-5986
    UR  - https://doi.org/10.11648/j.ajpst.20190502.11
    AB  - In this work Titanium Dioxide thin films were successfully deposited on glass substrates at room temperature by pulsed laser deposition technique (PLD) using a Q-switch Nd: YAG laser to fabricate thin films. The target was an Anatase TiO2 powder that converted to solid disks by compressing it. The disks were irradiated with different laser pulse energies (100, 150 and 200 mJ) with the same number of laser pulses (10 pulses) and the same laser repetition rate to fabricate three groups of thin film (I, II and III). An atomic force microscopy (AFM) was used for the characterization of the thickness and topography of these thin films. The results showed that the thickness of the films was in the range of hundreds nanometers and it is increased exponentially with the laser energy. The dependence of the root means squire roughness (RMS) on laser pulse energy also was investigated and the results showed that the (RMS) increase exponentially as laser pulse energy to specific value, and then decrease exponentially that the whole curve looks like Gaussian shape.
    VL  - 5
    IS  - 2
    ER  - 

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Author Information
  • Department of Laser System, Institute of Laser, Sudan University of Science and Technology, Khartoum, Sudan

  • Department of Physics, Almogran College of Science and Technology, Khartoum, Sudan

  • Department of General Science, Karary University, Omdurman, Sudan

  • Section