Surface Displacement Detection Using Coherent Laser and Machine Vision

Mario Gonzalez; Jim Williams; Claude Ratliff

doi:doi:10.11648/j.ae.20210502.15

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Surface Displacement Detection Using Coherent Laser and Machine Vision

Mario Gonzalez, Jim Williams, Claude Ratliff

Published in Applied Engineering (Volume 5, Issue 2)

Received: 6 October 2021 Accepted: 29 October 2021 Published: 5 November 2021

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Abstract

Ever since the discovery of the photoelectric theory and other inventions and discoveries, more and more devices that were only thought and designed to be in a laboratory environment since their inception have been migrating into the industrial environment because that environment has evolved and is absorbing laboratory grade equipment for easier inspection and faster, more accurate examinations. As a result, we have shorter analysis times and more exact, accurate, and repeatable measurements utilizing newer and fewer devices. These technologies allow for more advanced devices by merging different and sophisticated programming languages allowing these devices to become more and more versatile and making them easier to integrate with different industries and environments. In this document we intend to describe and explain mathematically and diagrammatically a new digital image processing algorithm considering different physical variables that can be easily adjusted or replaced with new individual components and different processing systems using only light projection, image capturing, and computational processing with all of them working together homogenously to output different and tangible numbers for further and easier analysis. One these different examples is described, tested, analyzed, and explained in detail in this document using only the previously mentioned devices in an industrial environment.

Published in	Applied Engineering (Volume 5, Issue 2)
DOI	10.11648/j.ae.20210502.15
Page(s)	66-71
Creative Commons	This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited.
Copyright	Copyright © The Author(s), 2021. Published by Science Publishing Group

Keywords

Laser, Surface Displacement, Artificial Vision, Machine Vision

References

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[3]	M. Griot, "Introduction to Laser Technology," Melles Griot Catalog, p. 36, 2018.
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[6]	M. Sonka, V. Hlavac and R. Boyle, "Image Processing, Analysis, and Machine Vision," ISBN 978-0-495-08252-1., 2008.
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[9]	T. Morris, "Computer Vision and Image Processing.," ISBN 978-0-333-99451-1., 2004.
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[12]	S. P. Tubbs, "Programmable Logic Controller (PLC) Tutorial, Siemens Simatic S7-1200.," Publicis MCD Werbeagentur GmbH; 3rd ed, 2018.
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APA Style

Mario Gonzalez, Jim Williams, Claude Ratliff. (2021). Surface Displacement Detection Using Coherent Laser and Machine Vision. Applied Engineering, 5(2), 66-71. https://doi.org/10.11648/j.ae.20210502.15

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ACS Style

Mario Gonzalez; Jim Williams; Claude Ratliff. Surface Displacement Detection Using Coherent Laser and Machine Vision. Appl. Eng. 2021, 5(2), 66-71. doi: 10.11648/j.ae.20210502.15

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AMA Style

Mario Gonzalez, Jim Williams, Claude Ratliff. Surface Displacement Detection Using Coherent Laser and Machine Vision. Appl Eng. 2021;5(2):66-71. doi: 10.11648/j.ae.20210502.15

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@article{10.11648/j.ae.20210502.15,
  author = {Mario Gonzalez and Jim Williams and Claude Ratliff},
  title = {Surface Displacement Detection Using Coherent Laser and Machine Vision},
  journal = {Applied Engineering},
  volume = {5},
  number = {2},
  pages = {66-71},
  doi = {10.11648/j.ae.20210502.15},
  url = {https://doi.org/10.11648/j.ae.20210502.15},
  eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.ae.20210502.15},
  abstract = {Ever since the discovery of the photoelectric theory and other inventions and discoveries, more and more devices that were only thought and designed to be in a laboratory environment since their inception have been migrating into the industrial environment because that environment has evolved and is absorbing laboratory grade equipment for easier inspection and faster, more accurate examinations. As a result, we have shorter analysis times and more exact, accurate, and repeatable measurements utilizing newer and fewer devices. These technologies allow for more advanced devices by merging different and sophisticated programming languages allowing these devices to become more and more versatile and making them easier to integrate with different industries and environments. In this document we intend to describe and explain mathematically and diagrammatically a new digital image processing algorithm considering different physical variables that can be easily adjusted or replaced with new individual components and different processing systems using only light projection, image capturing, and computational processing with all of them working together homogenously to output different and tangible numbers for further and easier analysis. One these different examples is described, tested, analyzed, and explained in detail in this document using only the previously mentioned devices in an industrial environment.},
 year = {2021}
}

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TY  - JOUR
T1  - Surface Displacement Detection Using Coherent Laser and Machine Vision
AU  - Mario Gonzalez
AU  - Jim Williams
AU  - Claude Ratliff
Y1  - 2021/11/05
PY  - 2021
N1  - https://doi.org/10.11648/j.ae.20210502.15
DO  - 10.11648/j.ae.20210502.15
T2  - Applied Engineering
JF  - Applied Engineering
JO  - Applied Engineering
SP  - 66
EP  - 71
PB  - Science Publishing Group
SN  - 2994-7456
UR  - https://doi.org/10.11648/j.ae.20210502.15
AB  - Ever since the discovery of the photoelectric theory and other inventions and discoveries, more and more devices that were only thought and designed to be in a laboratory environment since their inception have been migrating into the industrial environment because that environment has evolved and is absorbing laboratory grade equipment for easier inspection and faster, more accurate examinations. As a result, we have shorter analysis times and more exact, accurate, and repeatable measurements utilizing newer and fewer devices. These technologies allow for more advanced devices by merging different and sophisticated programming languages allowing these devices to become more and more versatile and making them easier to integrate with different industries and environments. In this document we intend to describe and explain mathematically and diagrammatically a new digital image processing algorithm considering different physical variables that can be easily adjusted or replaced with new individual components and different processing systems using only light projection, image capturing, and computational processing with all of them working together homogenously to output different and tangible numbers for further and easier analysis. One these different examples is described, tested, analyzed, and explained in detail in this document using only the previously mentioned devices in an industrial environment.
VL  - 5
IS  - 2
ER  -

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Author Information

Mario Gonzalez

Research and Development Department, Intouch Automation LLC, Novi, United States
Jim Williams

Research and Development Department, Intouch Automation LLC, Novi, United States
Claude Ratliff

Research and Development Department, Intouch Automation LLC, Novi, United States

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APA Style

Mario Gonzalez, Jim Williams, Claude Ratliff. (2021). Surface Displacement Detection Using Coherent Laser and Machine Vision. Applied Engineering, 5(2), 66-71. https://doi.org/10.11648/j.ae.20210502.15

Copy | Download

ACS Style

Mario Gonzalez; Jim Williams; Claude Ratliff. Surface Displacement Detection Using Coherent Laser and Machine Vision. Appl. Eng. 2021, 5(2), 66-71. doi: 10.11648/j.ae.20210502.15

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AMA Style

Mario Gonzalez, Jim Williams, Claude Ratliff. Surface Displacement Detection Using Coherent Laser and Machine Vision. Appl Eng. 2021;5(2):66-71. doi: 10.11648/j.ae.20210502.15

Copy | Download

@article{10.11648/j.ae.20210502.15,
  author = {Mario Gonzalez and Jim Williams and Claude Ratliff},
  title = {Surface Displacement Detection Using Coherent Laser and Machine Vision},
  journal = {Applied Engineering},
  volume = {5},
  number = {2},
  pages = {66-71},
  doi = {10.11648/j.ae.20210502.15},
  url = {https://doi.org/10.11648/j.ae.20210502.15},
  eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.ae.20210502.15},
  abstract = {Ever since the discovery of the photoelectric theory and other inventions and discoveries, more and more devices that were only thought and designed to be in a laboratory environment since their inception have been migrating into the industrial environment because that environment has evolved and is absorbing laboratory grade equipment for easier inspection and faster, more accurate examinations. As a result, we have shorter analysis times and more exact, accurate, and repeatable measurements utilizing newer and fewer devices. These technologies allow for more advanced devices by merging different and sophisticated programming languages allowing these devices to become more and more versatile and making them easier to integrate with different industries and environments. In this document we intend to describe and explain mathematically and diagrammatically a new digital image processing algorithm considering different physical variables that can be easily adjusted or replaced with new individual components and different processing systems using only light projection, image capturing, and computational processing with all of them working together homogenously to output different and tangible numbers for further and easier analysis. One these different examples is described, tested, analyzed, and explained in detail in this document using only the previously mentioned devices in an industrial environment.},
 year = {2021}
}

Copy | Download

TY  - JOUR
T1  - Surface Displacement Detection Using Coherent Laser and Machine Vision
AU  - Mario Gonzalez
AU  - Jim Williams
AU  - Claude Ratliff
Y1  - 2021/11/05
PY  - 2021
N1  - https://doi.org/10.11648/j.ae.20210502.15
DO  - 10.11648/j.ae.20210502.15
T2  - Applied Engineering
JF  - Applied Engineering
JO  - Applied Engineering
SP  - 66
EP  - 71
PB  - Science Publishing Group
SN  - 2994-7456
UR  - https://doi.org/10.11648/j.ae.20210502.15
AB  - Ever since the discovery of the photoelectric theory and other inventions and discoveries, more and more devices that were only thought and designed to be in a laboratory environment since their inception have been migrating into the industrial environment because that environment has evolved and is absorbing laboratory grade equipment for easier inspection and faster, more accurate examinations. As a result, we have shorter analysis times and more exact, accurate, and repeatable measurements utilizing newer and fewer devices. These technologies allow for more advanced devices by merging different and sophisticated programming languages allowing these devices to become more and more versatile and making them easier to integrate with different industries and environments. In this document we intend to describe and explain mathematically and diagrammatically a new digital image processing algorithm considering different physical variables that can be easily adjusted or replaced with new individual components and different processing systems using only light projection, image capturing, and computational processing with all of them working together homogenously to output different and tangible numbers for further and easier analysis. One these different examples is described, tested, analyzed, and explained in detail in this document using only the previously mentioned devices in an industrial environment.
VL  - 5
IS  - 2
ER  -

Copy | Download