Separate testing of hardware and software of embedded systems is insufficient. Communication between hardware and software parts needs to be tested during the integrated testing. Discussions about this problem are practically unavailable. Black-box criteria are used for hardware and software testing. This creates the conditions for formulating a unified test generation task and a single template for the generation of tests, as well as enabling a comparison between the criteria of test generation. Black-box criteria make it possible to start generating tests in the early design stages, once the initial software prototype is established. The test object is described in a finite state machine form. The availability of state variables enables the search for a compromise between test performance and quality in test generation. Experiments with two benchmarks showed which criterion of the black box approach is the most suitable for hardware and software testing and that the generation of integration tests according to two criteria is appropriate. The results are important for choosing a reasonable approach to embedded system integration testing.
| Published in | American Journal of Embedded Systems and Applications (Volume 1, Issue 1) |
| DOI | 10.11648/j.ajesa.20130101.11 |
| Page(s) | 1-12 |
| Creative Commons |
This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited. |
| Copyright |
Copyright © The Author(s), 2013. Published by Science Publishing Group |
mbedded Systems Testing, Hardware and Software Testing, General Testing Criteria
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APA Style
Rimantas Seinauskas, Vytenis Seinauskas. (2013). Examination of the Possibilities for Integrated Testing of Embedded Systems. American Journal of Embedded Systems and Applications, 1(1), 1-12. https://doi.org/10.11648/j.ajesa.20130101.11
ACS Style
Rimantas Seinauskas; Vytenis Seinauskas. Examination of the Possibilities for Integrated Testing of Embedded Systems. Am. J. Embed. Syst. Appl. 2013, 1(1), 1-12. doi: 10.11648/j.ajesa.20130101.11
AMA Style
Rimantas Seinauskas, Vytenis Seinauskas. Examination of the Possibilities for Integrated Testing of Embedded Systems. Am J Embed Syst Appl. 2013;1(1):1-12. doi: 10.11648/j.ajesa.20130101.11
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Download@article{10.11648/j.ajesa.20130101.11,
author = {Rimantas Seinauskas and Vytenis Seinauskas},
title = {Examination of the Possibilities for Integrated Testing of Embedded Systems},
journal = {American Journal of Embedded Systems and Applications},
volume = {1},
number = {1},
pages = {1-12},
doi = {10.11648/j.ajesa.20130101.11},
url = {https://doi.org/10.11648/j.ajesa.20130101.11},
eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.ajesa.20130101.11},
abstract = {Separate testing of hardware and software of embedded systems is insufficient. Communication between hardware and software parts needs to be tested during the integrated testing. Discussions about this problem are practically unavailable. Black-box criteria are used for hardware and software testing. This creates the conditions for formulating a unified test generation task and a single template for the generation of tests, as well as enabling a comparison between the criteria of test generation. Black-box criteria make it possible to start generating tests in the early design stages, once the initial software prototype is established. The test object is described in a finite state machine form. The availability of state variables enables the search for a compromise between test performance and quality in test generation. Experiments with two benchmarks showed which criterion of the black box approach is the most suitable for hardware and software testing and that the generation of integration tests according to two criteria is appropriate. The results are important for choosing a reasonable approach to embedded system integration testing.},
year = {2013}
}
TY - JOUR T1 - Examination of the Possibilities for Integrated Testing of Embedded Systems AU - Rimantas Seinauskas AU - Vytenis Seinauskas Y1 - 2013/08/20 PY - 2013 N1 - https://doi.org/10.11648/j.ajesa.20130101.11 DO - 10.11648/j.ajesa.20130101.11 T2 - American Journal of Embedded Systems and Applications JF - American Journal of Embedded Systems and Applications JO - American Journal of Embedded Systems and Applications SP - 1 EP - 12 PB - Science Publishing Group SN - 2376-6085 UR - https://doi.org/10.11648/j.ajesa.20130101.11 AB - Separate testing of hardware and software of embedded systems is insufficient. Communication between hardware and software parts needs to be tested during the integrated testing. Discussions about this problem are practically unavailable. Black-box criteria are used for hardware and software testing. This creates the conditions for formulating a unified test generation task and a single template for the generation of tests, as well as enabling a comparison between the criteria of test generation. Black-box criteria make it possible to start generating tests in the early design stages, once the initial software prototype is established. The test object is described in a finite state machine form. The availability of state variables enables the search for a compromise between test performance and quality in test generation. Experiments with two benchmarks showed which criterion of the black box approach is the most suitable for hardware and software testing and that the generation of integration tests according to two criteria is appropriate. The results are important for choosing a reasonable approach to embedded system integration testing. VL - 1 IS - 1 ER -
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