Due to its rapid popularity increase within last three decades, with particular focus on submicrometer quantitative surface’s properties imaging, atomic force microscopy (AFM) is still a subject of development and research in terms of both better understanding and efficient utilization of various measurement techniques. Quantitative and comparable measurements at nanoscale are a significant issue, as both: science and industry desire reliable results, allowing to perform repetitive experiments at any time and location. Therefore a numerous analysis and research projects were carried out to provide metrological approach for those techniques in terms of providing the traceability and the uncertainty estimation. In this paper an overview of various methods and approaches towards quantitative determination of the normal spring constant of the AFM probes is presented.
| Published in | Nanoscience and Nanometrology (Volume 2, Issue 1) |
| DOI | 10.11648/j.nsnm.20160201.12 |
| Page(s) | 8-29 |
| Creative Commons |
This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited. |
| Copyright |
Copyright © The Author(s), 2015. Published by Science Publishing Group |
Atomic Force Microscopy, Scanning Probe, Spring Constant, Calibration, Normal Force Measurement, Force Spectroscopy
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APA Style
Andrzej Sikora. (2015). Quantitative Normal Force Measurements by Means of Atomic Force Microscopy Towards the Accurate and Easy Spring Constant Determination. Nanoscience and Nanometrology, 2(1), 8-29. https://doi.org/10.11648/j.nsnm.20160201.12
ACS Style
Andrzej Sikora. Quantitative Normal Force Measurements by Means of Atomic Force Microscopy Towards the Accurate and Easy Spring Constant Determination. Nanosci. Nanometrol. 2015, 2(1), 8-29. doi: 10.11648/j.nsnm.20160201.12
AMA Style
Andrzej Sikora. Quantitative Normal Force Measurements by Means of Atomic Force Microscopy Towards the Accurate and Easy Spring Constant Determination. Nanosci Nanometrol. 2015;2(1):8-29. doi: 10.11648/j.nsnm.20160201.12
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Download@article{10.11648/j.nsnm.20160201.12,
author = {Andrzej Sikora},
title = {Quantitative Normal Force Measurements by Means of Atomic Force Microscopy Towards the Accurate and Easy Spring Constant Determination},
journal = {Nanoscience and Nanometrology},
volume = {2},
number = {1},
pages = {8-29},
doi = {10.11648/j.nsnm.20160201.12},
url = {https://doi.org/10.11648/j.nsnm.20160201.12},
eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.nsnm.20160201.12},
abstract = {Due to its rapid popularity increase within last three decades, with particular focus on submicrometer quantitative surface’s properties imaging, atomic force microscopy (AFM) is still a subject of development and research in terms of both better understanding and efficient utilization of various measurement techniques. Quantitative and comparable measurements at nanoscale are a significant issue, as both: science and industry desire reliable results, allowing to perform repetitive experiments at any time and location. Therefore a numerous analysis and research projects were carried out to provide metrological approach for those techniques in terms of providing the traceability and the uncertainty estimation. In this paper an overview of various methods and approaches towards quantitative determination of the normal spring constant of the AFM probes is presented.},
year = {2015}
}
TY - JOUR T1 - Quantitative Normal Force Measurements by Means of Atomic Force Microscopy Towards the Accurate and Easy Spring Constant Determination AU - Andrzej Sikora Y1 - 2015/10/14 PY - 2015 N1 - https://doi.org/10.11648/j.nsnm.20160201.12 DO - 10.11648/j.nsnm.20160201.12 T2 - Nanoscience and Nanometrology JF - Nanoscience and Nanometrology JO - Nanoscience and Nanometrology SP - 8 EP - 29 PB - Science Publishing Group SN - 2472-3630 UR - https://doi.org/10.11648/j.nsnm.20160201.12 AB - Due to its rapid popularity increase within last three decades, with particular focus on submicrometer quantitative surface’s properties imaging, atomic force microscopy (AFM) is still a subject of development and research in terms of both better understanding and efficient utilization of various measurement techniques. Quantitative and comparable measurements at nanoscale are a significant issue, as both: science and industry desire reliable results, allowing to perform repetitive experiments at any time and location. Therefore a numerous analysis and research projects were carried out to provide metrological approach for those techniques in terms of providing the traceability and the uncertainty estimation. In this paper an overview of various methods and approaches towards quantitative determination of the normal spring constant of the AFM probes is presented. VL - 2 IS - 1 ER -
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