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Our Quick Submission tool provides a fast and uncomplicated way for you to submit your manuscripts.
Special Issue Title | Article Processing Charge |
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Advances in X-ray Analysis: Characterization, Calibration, and Applications | 770 USD |
Upload your manuscript (Max 20MB, .doc, .docx, .tex)
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Submit your manuscript via our online submission system.
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Once you're logged in, click on "Submit to Special Issue" under the "Submissions" section. Follow the system prompts to successfully complete the submission.
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Please type "Advances in X-ray Analysis: Characterization, Calibration, and Applications Manuscript Submission" as the subject of your email.