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Effect of Increasing Temperature on 1.5 μm Spectroscopic Emission of Er3+ Ions Activated Phospho-silicate Thin Film

Received: 16 October 2021     Accepted: 15 November 2021     Published: 24 November 2021
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Abstract

Different concentrations of Er3+ ions- embedded nano-composite phospho-silicate ranging from 1 up to 3.5 mol % in thin film, symbolic as (S20P), (S20P1Er)T, (S20P2.5Er)T and (S20P3.5Er)T, respectively were prepared as advanced materials for planar waveguide application. Spin coating sol gel technique will be used to prepare the thin films. The prepared thin films optical and spectroscopic assessments were performed using transmittance, absorption, Raman, photoluminescence and refractive index (n) calculations. The observed transmittance T (%) and reflectance R (%) spectra were measured using Jasco V-570 spectrophotometer, in wavelength range (0.2-2.5 µm), confirmed good transparency for the prepared films, where the T (%) was higher than 92% and S20P1ErT was the most transparent one. The mentioned higher transparency presence was considered as a big challenge, especially after doping the silica gel with such higher phosphorus molar percent up to 20 mol %. Such challenge confirmed that the prepared thin films were suitable for the low losses and active planar waveguide fabrication. The room temperature photoluminescence (RTPL) quenching was observed at lower temperature 100°C for (S20P3.5Er)T. Emission at 1.5 µm upon excitation at 514.5 nm was detected and characteristic to the 4I13/24I15/2 erbium ions intra-4F transition for all prepared samples. The morphology of the prepared thin films was examined by using the Field emission scanning electron microscope (FESEM), while the measured film thickness obtained from cross section view from the (FESEM) give rise to 1.791 µm value for (S20P3.5Er)T. The bigger moderate thickness than 1 µm was an adequate parameter for supporting planar optical wave guide applications.

Published in International Journal of Photochemistry and Photobiology (Volume 5, Issue 2)
DOI 10.11648/j.ijpp.20210502.13
Page(s) 28-35
Creative Commons

This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited.

Copyright

Copyright © The Author(s), 2021. Published by Science Publishing Group

Keywords

Sol-Gel, Thin Film, Photoluminescence, (FESEM), Planar Waveguide

References
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    Eman Helmy Ahmed, Magdy Mohamed Hussein Ayoub, Ahmed Ismael Hashem, Claudia Wickleder, Matthias Adlung, et al. (2021). Effect of Increasing Temperature on 1.5 μm Spectroscopic Emission of Er3+ Ions Activated Phospho-silicate Thin Film. International Journal of Photochemistry and Photobiology, 5(2), 28-35. https://doi.org/10.11648/j.ijpp.20210502.13

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    ACS Style

    Eman Helmy Ahmed; Magdy Mohamed Hussein Ayoub; Ahmed Ismael Hashem; Claudia Wickleder; Matthias Adlung, et al. Effect of Increasing Temperature on 1.5 μm Spectroscopic Emission of Er3+ Ions Activated Phospho-silicate Thin Film. Int. J. Photochem. Photobiol. 2021, 5(2), 28-35. doi: 10.11648/j.ijpp.20210502.13

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    AMA Style

    Eman Helmy Ahmed, Magdy Mohamed Hussein Ayoub, Ahmed Ismael Hashem, Claudia Wickleder, Matthias Adlung, et al. Effect of Increasing Temperature on 1.5 μm Spectroscopic Emission of Er3+ Ions Activated Phospho-silicate Thin Film. Int J Photochem Photobiol. 2021;5(2):28-35. doi: 10.11648/j.ijpp.20210502.13

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  • @article{10.11648/j.ijpp.20210502.13,
      author = {Eman Helmy Ahmed and Magdy Mohamed Hussein Ayoub and Ahmed Ismael Hashem and Claudia Wickleder and Matthias Adlung and Amal Amin and Inas Kamal Battisha},
      title = {Effect of Increasing Temperature on 1.5 μm Spectroscopic Emission of Er3+ Ions Activated Phospho-silicate Thin Film},
      journal = {International Journal of Photochemistry and Photobiology},
      volume = {5},
      number = {2},
      pages = {28-35},
      doi = {10.11648/j.ijpp.20210502.13},
      url = {https://doi.org/10.11648/j.ijpp.20210502.13},
      eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.ijpp.20210502.13},
      abstract = {Different concentrations of Er3+ ions- embedded nano-composite phospho-silicate ranging from 1 up to 3.5 mol % in thin film, symbolic as (S20P), (S20P1Er)T, (S20P2.5Er)T and (S20P3.5Er)T, respectively were prepared as advanced materials for planar waveguide application. Spin coating sol gel technique will be used to prepare the thin films. The prepared thin films optical and spectroscopic assessments were performed using transmittance, absorption, Raman, photoluminescence and refractive index (n) calculations. The observed transmittance T (%) and reflectance R (%) spectra were measured using Jasco V-570 spectrophotometer, in wavelength range (0.2-2.5 µm), confirmed good transparency for the prepared films, where the T (%) was higher than 92% and S20P1ErT was the most transparent one. The mentioned higher transparency presence was considered as a big challenge, especially after doping the silica gel with such higher phosphorus molar percent up to 20 mol %. Such challenge confirmed that the prepared thin films were suitable for the low losses and active planar waveguide fabrication. The room temperature photoluminescence (RTPL) quenching was observed at lower temperature 100°C for (S20P3.5Er)T. Emission at 1.5 µm upon excitation at 514.5 nm was detected and characteristic to the 4I13/2→4I15/2 erbium ions intra-4F transition for all prepared samples. The morphology of the prepared thin films was examined by using the Field emission scanning electron microscope (FESEM), while the measured film thickness obtained from cross section view from the (FESEM) give rise to 1.791 µm value for (S20P3.5Er)T. The bigger moderate thickness than 1 µm was an adequate parameter for supporting planar optical wave guide applications.},
     year = {2021}
    }
    

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  • TY  - JOUR
    T1  - Effect of Increasing Temperature on 1.5 μm Spectroscopic Emission of Er3+ Ions Activated Phospho-silicate Thin Film
    AU  - Eman Helmy Ahmed
    AU  - Magdy Mohamed Hussein Ayoub
    AU  - Ahmed Ismael Hashem
    AU  - Claudia Wickleder
    AU  - Matthias Adlung
    AU  - Amal Amin
    AU  - Inas Kamal Battisha
    Y1  - 2021/11/24
    PY  - 2021
    N1  - https://doi.org/10.11648/j.ijpp.20210502.13
    DO  - 10.11648/j.ijpp.20210502.13
    T2  - International Journal of Photochemistry and Photobiology
    JF  - International Journal of Photochemistry and Photobiology
    JO  - International Journal of Photochemistry and Photobiology
    SP  - 28
    EP  - 35
    PB  - Science Publishing Group
    SN  - 2640-429X
    UR  - https://doi.org/10.11648/j.ijpp.20210502.13
    AB  - Different concentrations of Er3+ ions- embedded nano-composite phospho-silicate ranging from 1 up to 3.5 mol % in thin film, symbolic as (S20P), (S20P1Er)T, (S20P2.5Er)T and (S20P3.5Er)T, respectively were prepared as advanced materials for planar waveguide application. Spin coating sol gel technique will be used to prepare the thin films. The prepared thin films optical and spectroscopic assessments were performed using transmittance, absorption, Raman, photoluminescence and refractive index (n) calculations. The observed transmittance T (%) and reflectance R (%) spectra were measured using Jasco V-570 spectrophotometer, in wavelength range (0.2-2.5 µm), confirmed good transparency for the prepared films, where the T (%) was higher than 92% and S20P1ErT was the most transparent one. The mentioned higher transparency presence was considered as a big challenge, especially after doping the silica gel with such higher phosphorus molar percent up to 20 mol %. Such challenge confirmed that the prepared thin films were suitable for the low losses and active planar waveguide fabrication. The room temperature photoluminescence (RTPL) quenching was observed at lower temperature 100°C for (S20P3.5Er)T. Emission at 1.5 µm upon excitation at 514.5 nm was detected and characteristic to the 4I13/2→4I15/2 erbium ions intra-4F transition for all prepared samples. The morphology of the prepared thin films was examined by using the Field emission scanning electron microscope (FESEM), while the measured film thickness obtained from cross section view from the (FESEM) give rise to 1.791 µm value for (S20P3.5Er)T. The bigger moderate thickness than 1 µm was an adequate parameter for supporting planar optical wave guide applications.
    VL  - 5
    IS  - 2
    ER  - 

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Author Information
  • Polymers and Pigments Department, Chemical Industries Research Institute, National Research Centre (NRC), Giza, Egypt

  • Polymers and Pigments Department, Chemical Industries Research Institute, National Research Centre (NRC), Giza, Egypt

  • Chemistry Department, Ain Shams University, Cairo, Egypt

  • Inorganic Chemistry, Faculty of Science and Technology, University of Siegen, Siegen, Germany

  • Inorganic Chemistry, Faculty of Science and Technology, University of Siegen, Siegen, Germany

  • Polymers and Pigments Department, Chemical Industries Research Institute, National Research Centre (NRC), Giza, Egypt

  • Solid State Physics Department, Physics Research Institute, National Research Centre (NRC), Giza, Egypt

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