Thin films of copper zinc tin sulphide (CZTS) have been deposited on glass substrate at various solution concentration and angular speed using sol-gel spin coating technique. Surface morphology showed that the deposited layers are continuous and pinhole free. The film’s particles are evenly distributed and adhered firmly to the substrates. X-ray diffraction studies revealed that the films are polycrystalline with tetragonal kesterite structure. Interplanar spacing and average crystallite size were estimated as 3.732 Å and 56.53 nm. Film’s thickness and stoichiometry were determined from Rutherford Backscattering Spectroscopy (RBS) as127 nm and Cu1.5Zn1.0Sn1.1S4.4O3.3. Optical studies showed that the deposited films exhibit direct band transition. The values of the energy gap were found between 1.30 and 1.60 eV. The result of the study suggested that the deposited CZTS thin films can perform as a good absorber material in nanostructured optoelectronic devices.
| Published in | Journal of Photonic Materials and Technology (Volume 5, Issue 2) |
| DOI | 10.11648/j.jmpt.20190502.13 |
| Page(s) | 38-45 |
| Creative Commons |
This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited. |
| Copyright |
Copyright © The Author(s), 2020. Published by Science Publishing Group |
Polycrystalline, Sol-gel Spin Coating, Surface Morphology, Crystal Diffraction, Optoelectronic Devices
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APA Style
Rafiu Adewale Busari, Bidini Alade Taleatu, Saheed Adekunle Adewinbi, Olusegun Emanuel Adewumi, Adeniyi Yisau Fasasi. (2020). Surface Characterisation of Spin Coated Quaternary Chalcogenide CZT(S, O) Thin Film for Optoelectronic Applications. Journal of Photonic Materials and Technology, 5(2), 38-45. https://doi.org/10.11648/j.jmpt.20190502.13
ACS Style
Rafiu Adewale Busari; Bidini Alade Taleatu; Saheed Adekunle Adewinbi; Olusegun Emanuel Adewumi; Adeniyi Yisau Fasasi. Surface Characterisation of Spin Coated Quaternary Chalcogenide CZT(S, O) Thin Film for Optoelectronic Applications. J. Photonic Mater. Technol. 2020, 5(2), 38-45. doi: 10.11648/j.jmpt.20190502.13
AMA Style
Rafiu Adewale Busari, Bidini Alade Taleatu, Saheed Adekunle Adewinbi, Olusegun Emanuel Adewumi, Adeniyi Yisau Fasasi. Surface Characterisation of Spin Coated Quaternary Chalcogenide CZT(S, O) Thin Film for Optoelectronic Applications. J Photonic Mater Technol. 2020;5(2):38-45. doi: 10.11648/j.jmpt.20190502.13
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Download@article{10.11648/j.jmpt.20190502.13,
author = {Rafiu Adewale Busari and Bidini Alade Taleatu and Saheed Adekunle Adewinbi and Olusegun Emanuel Adewumi and Adeniyi Yisau Fasasi},
title = {Surface Characterisation of Spin Coated Quaternary Chalcogenide CZT(S, O) Thin Film for Optoelectronic Applications},
journal = {Journal of Photonic Materials and Technology},
volume = {5},
number = {2},
pages = {38-45},
doi = {10.11648/j.jmpt.20190502.13},
url = {https://doi.org/10.11648/j.jmpt.20190502.13},
eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.jmpt.20190502.13},
abstract = {Thin films of copper zinc tin sulphide (CZTS) have been deposited on glass substrate at various solution concentration and angular speed using sol-gel spin coating technique. Surface morphology showed that the deposited layers are continuous and pinhole free. The film’s particles are evenly distributed and adhered firmly to the substrates. X-ray diffraction studies revealed that the films are polycrystalline with tetragonal kesterite structure. Interplanar spacing and average crystallite size were estimated as 3.732 Å and 56.53 nm. Film’s thickness and stoichiometry were determined from Rutherford Backscattering Spectroscopy (RBS) as127 nm and Cu1.5Zn1.0Sn1.1S4.4O3.3. Optical studies showed that the deposited films exhibit direct band transition. The values of the energy gap were found between 1.30 and 1.60 eV. The result of the study suggested that the deposited CZTS thin films can perform as a good absorber material in nanostructured optoelectronic devices.},
year = {2020}
}
TY - JOUR T1 - Surface Characterisation of Spin Coated Quaternary Chalcogenide CZT(S, O) Thin Film for Optoelectronic Applications AU - Rafiu Adewale Busari AU - Bidini Alade Taleatu AU - Saheed Adekunle Adewinbi AU - Olusegun Emanuel Adewumi AU - Adeniyi Yisau Fasasi Y1 - 2020/01/07 PY - 2020 N1 - https://doi.org/10.11648/j.jmpt.20190502.13 DO - 10.11648/j.jmpt.20190502.13 T2 - Journal of Photonic Materials and Technology JF - Journal of Photonic Materials and Technology JO - Journal of Photonic Materials and Technology SP - 38 EP - 45 PB - Science Publishing Group SN - 2469-8431 UR - https://doi.org/10.11648/j.jmpt.20190502.13 AB - Thin films of copper zinc tin sulphide (CZTS) have been deposited on glass substrate at various solution concentration and angular speed using sol-gel spin coating technique. Surface morphology showed that the deposited layers are continuous and pinhole free. The film’s particles are evenly distributed and adhered firmly to the substrates. X-ray diffraction studies revealed that the films are polycrystalline with tetragonal kesterite structure. Interplanar spacing and average crystallite size were estimated as 3.732 Å and 56.53 nm. Film’s thickness and stoichiometry were determined from Rutherford Backscattering Spectroscopy (RBS) as127 nm and Cu1.5Zn1.0Sn1.1S4.4O3.3. Optical studies showed that the deposited films exhibit direct band transition. The values of the energy gap were found between 1.30 and 1.60 eV. The result of the study suggested that the deposited CZTS thin films can perform as a good absorber material in nanostructured optoelectronic devices. VL - 5 IS - 2 ER -
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